Share Email Print

Proceedings Paper

X-ray nanotomography in a SEM
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

We have developed an x-ray computer tomography (CT) add-on to perform X-ray micro- and nanotomography in any scanning electron microscope (SEM). The electron beam inside the SEM is focused on a metal target to generate x-rays. Part of the X-rays pass through the object that is installed on a rotation stage. Shadow X-ray images are collected by a CCD camera with direct photon detection mounted on the external wall of the SEM specimen chamber. An extensive description on the working principles of this micro/nano-CT add-on together with some examples of CT-scans will be given in this paper. The resolution that can be obtained with this set-up and the influence of the shape of the electron beam are discussed. Furthermore, possible improvements on this SEM-CT set-up will be discussed: replacing the backilluminated CCD with a fully depleted CCD with improved quantum efficiency (QE) for higher energies, reduces the exposure time by 6 when using metal targets with x-ray characteristic lines around 10 keV.

Paper Details

Date Published: 1 September 2010
PDF: 8 pages
Proc. SPIE 7804, Developments in X-Ray Tomography VII, 78040S (1 September 2010); doi: 10.1117/12.860201
Show Author Affiliations
Bart Pauwels, SkyScan N.V. (Belgium)
Xuan Liu, SkyScan N.V. (Belgium)
Alexander Sasov, SkyScan N.V. (Belgium)

Published in SPIE Proceedings Vol. 7804:
Developments in X-Ray Tomography VII
Stuart R. Stock, Editor(s)

© SPIE. Terms of Use
Back to Top