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Proceedings Paper

Organic electro-optic single crystalline films for integrated optics
Author(s): Mojca Jazbinsek; Harry Figi; Christoph Hunziker; Blanca Ruiz; Seong-Ji Kwon; O-Pil Kwon; Zhou Yang; Peter Günter
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Paper Abstract

We have fabricated organic electro-optic single crystalline thin films on various inorganic substrates. A high refractive index contrast of up to Δn = +0.6 at 1.55 μm with respect to glass substrates and up to Δn = -1.9 at 1.55 μm with respect to silicon substrates has been achieved. The single crystalline films can be grown quasi-epitaxially without lattice matching and also on amorphous substrates providing appropriate interface interactions and solid-liquid phase equilibrium conditions. The thickness of the single-crystalline films can vary between less than 30 nm and above 5000 nm; they are therefore appropriate for optical waveguiding structures, as well as nano-size electro-optic structures needed for future nanophotonics. Several organic electro-optic crystalline materials have been employed using solution or melt-based processing. The techniques are suitable for the fabrication of conventional wire electro-optic waveguides, silicon-organic hybrid electro-optic waveguides, as well as more complex organic-inorganic structures such as single-crystalline electro-optic microring resonators.

Paper Details

Date Published: 26 August 2010
PDF: 10 pages
Proc. SPIE 7774, Linear and Nonlinear Optics of Organic Materials X, 77740Q (26 August 2010); doi: 10.1117/12.860191
Show Author Affiliations
Mojca Jazbinsek, ETH Zürich (Switzerland)
Rainbow Photonics AG (Switzerland)
Harry Figi, ETH Zürich (Switzerland)
Christoph Hunziker, ETH Zürich (Switzerland)
Blanca Ruiz, ETH Zürich (Switzerland)
Rainbow Photonics AG (Switzerland)
Seong-Ji Kwon, ETH Zürich (Switzerland)
O-Pil Kwon, ETH Zürich (Switzerland)
Zhou Yang, ETH Zürich (Switzerland)
Peter Günter, ETH Zürich (Switzerland)
Rainbow Photonics AG (Switzerland)

Published in SPIE Proceedings Vol. 7774:
Linear and Nonlinear Optics of Organic Materials X
Manfred Eich; Jean-Michel Nunzi; Rachel Jakubiak; Theodore G. Goodson III, Editor(s)

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