Share Email Print
cover

Proceedings Paper

Improvements of nanometer particle's measuring system based on photon correlation spectroscopy
Author(s): Shaoyong Deng; Qi Zhang; Junying Xia; Yan Xiong; Shaofeng Guo; Yisheng Yang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The measuring system based on photon correlation spectroscopy is improved through several means. The distribution of nanometer particle's sizes measured by new systems is more stable and accurate. All of the experiments are done in an ultra-clean chamber. The temperature is controlled and changes from about 13 degrees centigrade to 22 degrees centigrade. Fibers with different core diameters are used to transmit scattering light. The "Y" type fibers with different core diameters are used to transmit both the incident laser and the scattering light. The microscope objectives with different numerical apertures are used to collect and couple the scattering light into fiber. The software of real time correlation is tried to be used in the measuring system and it is compared with the static correlation. The Labview is used to integrate the software of correlation and inverse algorithms of nanometer particle sizes. Influences of incident laser with different power and mode are analyzed.

Paper Details

Date Published: 2 September 2010
PDF: 12 pages
Proc. SPIE 7792, Reflection, Scattering, and Diffraction from Surfaces II, 779215 (2 September 2010); doi: 10.1117/12.859957
Show Author Affiliations
Shaoyong Deng, National Univ. of Defense Technology (China)
Qi Zhang, National Univ. of Defense Technology (China)
Junying Xia, National Univ. of Defense Technology (China)
Yan Xiong, National Univ. of Defense Technology (China)
Shaofeng Guo, National Univ. of Defense Technology (China)
Yisheng Yang, National Univ. of Defense Technology (China)


Published in SPIE Proceedings Vol. 7792:
Reflection, Scattering, and Diffraction from Surfaces II
Zu-Han Gu; Leonard M. Hanssen, Editor(s)

© SPIE. Terms of Use
Back to Top