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Proceedings Paper

Topography measurements for correlations of standard cartridge cases
Author(s): T. V. Vorburger; J. Song; W. Chu; T. B. Renegar; A. Zheng; J. Yen; R. M. Thompson; R. Silver; B. Bachrach; M. Ols
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Paper Abstract

The National Institute of Standards and Technology Standard Reference Materials (SRM) 2460 Standard Bullets and 2461 Standard Cartridge Cases are intended for use as check standards for crime laboratories to help verify that their computerized optical imaging equipment for ballistics image acquisitions and correlations is operating properly. Using topography measurements and cross-correlation methods, our earlier results for the SRM bullets and recent results for the SRM cartridge cases both demonstrate that the individual units of the SRMs are highly reproducible. Currently, we are developing procedures for topographic imaging of the firing pin impressions, breech face impressions, and ejector marks of the standard cartridge cases. The initial results lead us to conclude that all three areas can be measured accurately and routinely using confocal techniques. We are also nearing conclusion of a project with crime lab experts to test sets of both SRM cartridge cases and SRM bullets using the automated commercial systems of the National Integrated Ballistics Information Network.

Paper Details

Date Published: 10 June 2010
PDF: 10 pages
Proc. SPIE 7729, Scanning Microscopy 2010, 77291D (10 June 2010); doi: 10.1117/12.859918
Show Author Affiliations
T. V. Vorburger, National Institute of Standards and Technology (United States)
J. Song, National Institute of Standards and Technology (United States)
W. Chu, National Institute of Standards and Technology (United States)
T. B. Renegar, National Institute of Standards and Technology (United States)
A. Zheng, National Institute of Standards and Technology (United States)
J. Yen, National Institute of Standards and Technology (United States)
R. M. Thompson, National Institute of Standards and Technology (United States)
R. Silver, National Institute of Standards and Technology (United States)
B. Bachrach, Intelligent Automation, Inc. (United States)
M. Ols, Bureau of Alcohol, Tobacco, Firearms, and Explosives (United States)


Published in SPIE Proceedings Vol. 7729:
Scanning Microscopy 2010
Michael T. Postek; Dale E. Newbury; S. Frank Platek; David C. Joy, Editor(s)

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