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Proceedings Paper

Dedicated testing setup for panoramic lenses
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Paper Abstract

Panoramic imaging is of growing importance in many applications around the world spurred by the development of digital imaging. Panoramic lens characteristics are unique and their careful characterization can be a challenge. For example, the price to pay for a large field of view in this type of lens is high distortion in the image. For vision applications like security or inspection, a precise knowledge of the distortion introduced by panoramic lenses is essential to produce natural unwrapped views to the operator. Of special concern is the image quality which must be uniformed over the entire field of view because all directions are equally important. In addition, two hemispheric images can also be stitched together to create a complete spherical image. For these reasons, we have developed a dedicated setup to study the distortion and the image quality produced by panoramic lenses. The test setup is made of a 75-cm radius cylindrical structure with targets placed on it. Using referenced equally-spaced targets, we obtained the radial image mapping curves for various azymuthal angles, allowing us to calculate the full-field resolution map. Also, transition targets were used to find field-dependent spatial frequency where the MTF is 50%. We tested four different panoramic lenses, two panomorph lenses and two fisheyes. For each lens, we discussed the experimental resolution and MTF curves and compared some of those results to theoretical design data.

Paper Details

Date Published: 19 August 2010
PDF: 7 pages
Proc. SPIE 7786, Current Developments in Lens Design and Optical Engineering XI; and Advances in Thin Film Coatings VI, 77860W (19 August 2010); doi: 10.1117/12.859909
Show Author Affiliations
Anne-Sophie Poulin-Girard, Univ. Laval (Canada)
Jocelyn Parent, Univ. Laval (Canada)
Simon Thibault, Univ. Laval (Canada)
Pierre Désaulniers, Univ. Laval (Canada)

Published in SPIE Proceedings Vol. 7786:
Current Developments in Lens Design and Optical Engineering XI; and Advances in Thin Film Coatings VI
R. Barry Johnson; Virendra N. Mahajan; Simon Thibault, Editor(s)

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