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Proceedings Paper

Investigation of aberrations of Kirkpatrick-Baez mirrors
Author(s): Bodo Ehlers; Boris Verman
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Paper Abstract

The flux distributions in the focal plane of Kirkpatrick-Baez optics are investigated as the parameters of the focusing ellipse of the mirrors are changed from typical laboratory optics to synchrotron beam line optics. This work shows the effects of the most predominant focusing imperfections that arise from conditions that violate the original assumptions of Kirkpatrick-Baez systems, including orthogonality of the mirror surfaces and paraxial rays.

Paper Details

Date Published: 27 August 2010
PDF: 9 pages
Proc. SPIE 7802, Advances in X-Ray/EUV Optics and Components V, 78020F (27 August 2010); doi: 10.1117/12.859850
Show Author Affiliations
Bodo Ehlers, Rigaku Innovative Technologies (United States)
Boris Verman, Rigaku Innovative Technologies (United States)


Published in SPIE Proceedings Vol. 7802:
Advances in X-Ray/EUV Optics and Components V
Shunji Goto; Ali M. Khounsary; Christian Morawe, Editor(s)

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