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Proceedings Paper

3D shape sensing using a phase mask to extend the depth measuring range
Author(s): Wei-Hung Su; Chun-Hsiang Hsu
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Paper Abstract

An approach using a phase mask to enlarge the depth measuring range for a 3D shape sensing system is presented. A microscope combined with a wide-angle eyepiece lens is employed to project a fringe pattern onto the inspected surface. A CCD camera observes the projected fringes through another microscope with a phase mask. The phase mask enlarges the depth of field of the image acquisition system, while the wide-angle eyepiece lens increases the depth of focus of the fringe projection system. It is found that the depth measuring range has been extended up to 1600-micron, even though the depth of field of the image acquisition system is only 80-micron.

Paper Details

Date Published: 18 August 2010
PDF: 8 pages
Proc. SPIE 7781, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications IV, 77810Q (18 August 2010); doi: 10.1117/12.859768
Show Author Affiliations
Wei-Hung Su, National Sun Yat-Sen Univ. (Taiwan)
Chun-Hsiang Hsu, National Sun Yat-Sen Univ. (Taiwan)


Published in SPIE Proceedings Vol. 7781:
Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications IV
Shizhuo Yin; Ruyan Guo, Editor(s)

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