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Proceedings Paper

Optical efficiency of feedhorn-coupled TES polarimeters for next-generation CMB instruments
Author(s): J. W. Henning; J. W. Appel; J. E. Austermann; J. A. Beall; D. Becker; D. A. Bennett; L. E. Bleem; B. A. Benson; J. Britton; J. E. Carlstrom; C. L. Chang; H. M. Cho; A. T. Crites; T. Essinger-Hileman; W. Everett; E. M. George; N. W. Halverson; G. C. Hilton; W. L. Holzapfel; J. Hubmayr; K. D. Irwin; D. Li; J. McMahon; J. Mehl; S. S. Meyer; S. Moseley; J. P. Nibarger; M. D. Niemack; L. P. Parker; E. Shirokoff; S. M. Simon; S. T. Staggs; J. N. Ullom; K. U-Yen; C. Visnjic; E. Wollack; K. W. Yoon; E. Y. Young; Y. Zhao
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Paper Abstract

The next generation of Cosmic Microwave Background (CMB) experiments probing for signals of inflation and small angular scale polarization anisotropies require higher sensitivity and better control of systematics. We are developing monolithic arrays of orthomode transducer (OMT) coupled transition edge sensor (TES) polarimeters designed for operation at 150 GHz to address these requirements. OMT coupling allows for simultaneous and independent detection of two orthogonal linear polarization states incident on a single pixel. We present measurements of optical efficiencies ηop of single pixels with on-chip band-defining filters, with ηop = 57±4 stat±9 sys %. We also provide evidence for an out-of-band blue leak and address possible sources as well as mitigation techniques. Additionally, we discuss methods for increasing efficiency being implemented in the next generation of pixels, currently in fabrication. Still under development, these pixels are produced as monolithic polarimeter arrays and are slated for use in the Atacama Cosmology Telescope Polarization (ACTpol) and South Pole Telescope Polarization (SPTpol) experiments, while single-pixel polarimeters are to be deployed in the Atacama B-mode Search (ABS) experiment.

Paper Details

Date Published: 15 July 2010
PDF: 10 pages
Proc. SPIE 7741, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy V, 774122 (15 July 2010); doi: 10.1117/12.859478
Show Author Affiliations
J. W. Henning, Univ. of Colorado at Boulder (United States)
J. W. Appel, Princeton Univ. (United States)
J. E. Austermann, Univ. of Colorado at Boulder (United States)
J. A. Beall, National Institute of Standards and Technology (United States)
D. Becker, National Institute of Standards and Technology (United States)
D. A. Bennett, National Institute of Standards and Technology (United States)
L. E. Bleem, Univ. of Chicago (United States)
B. A. Benson, Univ. of Chicago (United States)
J. Britton, National Institute of Standards and Technology (United States)
J. E. Carlstrom, Univ. of Chicago (United States)
C. L. Chang, Univ. of Chicago (United States)
H. M. Cho, National Institute of Standards and Technology (United States)
A. T. Crites, Univ. of Chicago (United States)
T. Essinger-Hileman, Princeton Univ. (United States)
W. Everett, Univ. of Chicago (United States)
E. M. George, Univ. of California, Berkeley (United States)
N. W. Halverson, Univ. of Colorado at Boulder (United States)
G. C. Hilton, National Institute of Standards and Technology (United States)
W. L. Holzapfel, Univ. of California, Berkeley (United States)
J. Hubmayr, National Institute of Standards and Technology (United States)
K. D. Irwin, National Institute of Standards and Technology (United States)
D. Li, National Institute of Standards and Technology (United States)
J. McMahon, Univ. of Michigan (United States)
J. Mehl, Univ. of Chicago (United States)
S. S. Meyer, Univ. of Chicago (United States)
S. Moseley, NASA Goddard Space Flight Ctr. (United States)
J. P. Nibarger, National Institute of Standards and Technology (United States)
M. D. Niemack, National Institute of Standards and Technology (United States)
L. P. Parker, Princeton Univ. (United States)
E. Shirokoff, Univ. of California, Berkeley (United States)
S. M. Simon, Univ. of Colorado at Boulder (United States)
S. T. Staggs, Princeton Univ. (United States)
J. N. Ullom, National Institute of Standards and Technology (United States)
K. U-Yen, NASA Goddard Space Flight Ctr. (United States)
C. Visnjic, Princeton Univ. (United States)
E. Wollack, NASA Goddard Space Flight Ctr. (United States)
K. W. Yoon, National Institute of Standards and Technology (United States)
E. Y. Young, Univ. of California, Berkeley (United States)
Y. Zhao, Princeton Univ. (United States)


Published in SPIE Proceedings Vol. 7741:
Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy V
Wayne S. Holland; Jonas Zmuidzinas, Editor(s)

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