Share Email Print

Proceedings Paper

The development of an automatic scanning path generation method for the spinneret test
Author(s): Chun-Jen Chen; Min-Wei Hung; Wenyuh Jywe; Donyau Chiang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

An automatic scanning path generation method is developed. The method is based on a 3-axis automatic inspection system which is used to detect the clearance ratio of spinneret plate. The user can rely on this method to automatically generate the scanning path for an unknown spinneret plate in the spinneret test. Then the scanning path can be learned by the inspection system and repeated it for other the same spinneret. Two type spinnerets are introduced in this paper to describe the automatic scanning path generation method. In this paper, the 3-axis automatic inspection system includes a 3-axes motorized linear stage, a telcentric lens, a top light source, a bottom light source, 1 CCD camera and a controlled PC.

Paper Details

Date Published: 7 September 2010
PDF: 8 pages
Proc. SPIE 7798, Applications of Digital Image Processing XXXIII, 779820 (7 September 2010); doi: 10.1117/12.859237
Show Author Affiliations
Chun-Jen Chen, Instrument Technology Research Ctr. (Taiwan)
Min-Wei Hung, Instrument Technology Research Ctr. (Taiwan)
Wenyuh Jywe, Instrument Technology Research Ctr. (Taiwan)
Donyau Chiang, Instrument Technology Research Ctr. (Taiwan)

Published in SPIE Proceedings Vol. 7798:
Applications of Digital Image Processing XXXIII
Andrew G. Tescher, Editor(s)

© SPIE. Terms of Use
Back to Top