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Proceedings Paper

Characteristics of the depth of focus in a high-NA optical system with a SIAX for data storage
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Paper Abstract

We study the tolerance characteristic of SIAX and suggest a newly designed SIL-Axicon system for the better tolerances. Methods for checking beam quality, optimization and remaining problems are suggested. SIL-Axicon system shows more tolerances in the uniformity of beam incident angle. Bessel beam (BB) with SIL can be used for multi layer high density data storage systems. We study the tolerance characteristic of SIAX and suggest a newly designed SIL-Axicon system for the better tolerances.

Paper Details

Date Published: 3 June 2010
PDF: 7 pages
Proc. SPIE 7730, Optical Data Storage 2010, 77300M (3 June 2010); doi: 10.1117/12.859234
Show Author Affiliations
Jaisoon Kim, Myongji Univ. (Korea, Republic of)
Moonseok Kim, Seoul National Univ. (Korea, Republic of)
Sukjoon Hong, Seoul National Univ. (Korea, Republic of)
Tom D. Milster, College of Optical Sciences, The Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 7730:
Optical Data Storage 2010
Susanna Orlic; Ryuichi Katayama, Editor(s)

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