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Proceedings Paper

A multi-energy method of nondestructive testing by determination of the effective atomic number of different materials
Author(s): Volodymyr D. Ryzhikov; Oleksandr D. Opolonin; Sergiy M. Galkin; Yevgeniy F. Voronkin; Olena K. Lysetska; Serhiy A. Kostioukevitch
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Paper Abstract

Development and studies of characteristics are reported for X-ray radiation detectors of "scintillator-photodiode" type showing improved spatial resolution with photosensitive area step of 1.6, 0.8, 0.4 and 0.2 mm and number of channels 16, 32, 128 and 256, respectively. The receiving-detecting channel has been adjusted and tested, appropriate software has been developed, and shadow X-ray images of tested objects were obtained. Evaluations were made of spatial resolution, resolution over thickness and detecting ability of the digital radiographic sysyem based on the detector array. Recommendations are formulated on application of such devices for non-destructive testing and technical diagnostics. Further studies on obtaining two-energy images show possibilities of substantial broadening of the application fields of the digital radiographic system, allowing determination of the effective atomic number Zeff for component substances of the tested objects. A possibility is shown of substance discrimination by their effective atomic number even for "light" elements with Zeff from 6 to 13. Clear distinction could be observed between such substances as water (H2O) with Zeff≈7.43 and glycerol (CH2OHCHOHCH2OH) with Zeff≈ 6.87.

Paper Details

Date Published: 27 August 2010
PDF: 9 pages
Proc. SPIE 7805, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XII, 78051P (27 August 2010); doi: 10.1117/12.858267
Show Author Affiliations
Volodymyr D. Ryzhikov, Institute for Single Crystals (Ukraine)
Oleksandr D. Opolonin, Institute for Single Crystals (Ukraine)
Sergiy M. Galkin, Institute for Single Crystals (Ukraine)
Yevgeniy F. Voronkin, Institute for Single Crystals (Ukraine)
Olena K. Lysetska, Institute for Single Crystals (Ukraine)
Serhiy A. Kostioukevitch, Institute of Semiconductor Physics (Ukraine)


Published in SPIE Proceedings Vol. 7805:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XII
Arnold Burger; Larry A. Franks; Ralph B. James, Editor(s)

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