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Proceedings Paper

ACTPol: a polarization-sensitive receiver for the Atacama Cosmology Telescope
Author(s): M. D. Niemack; P. A. R. Ade; J. Aguirre; F. Barrientos; J. A. Beall; J. R. Bond; J. Britton; H. M. Cho; S. Das; M. J. Devlin; S. Dicker; J. Dunkley; R. Dünner; J. W. Fowler; A. Hajian; M. Halpern; M. Hasselfield; G. C. Hilton; M. Hilton; J. Hubmayr; J. P. Hughes; L. Infante; K. D. Irwin; N. Jarosik; J. Klein; A. Kosowsky; T. A. Marriage; J. McMahon; F. Menanteau; K. Moodley; J. P. Nibarger; M. R. Nolta; L. A. Page; B. Partridge; E. D. Reese; J. Sievers; D. N. Spergel; S. T. Staggs; R. Thornton; C. Tucker; E. Wollack; K. W. Yoon
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Paper Abstract

The six-meter Atacama Cosmology Telescope (ACT) in Chile was built to measure the cosmic microwave background (CMB) at arcminute angular scales. We are building a new polarization sensitive receiver for ACT (ACTPol). ACTPol will characterize the gravitational lensing of the CMB and aims to constrain the sum of the neutrino masses with ~ 0.05 eV precision, the running of the spectral index of inflation-induced fluctuations, and the primordial helium abundance to better than 1 %. Our observing fields will overlap with the SDSS BOSS survey at optical wavelengths, enabling a variety of cross-correlation science, including studies of the growth of cosmic structure from Sunyaev-Zel'dovich observations of clusters of galaxies as well as independent constraints on the sum of the neutrino masses. We describe the science objectives and the initial receiver design.

Paper Details

Date Published: 15 July 2010
PDF: 21 pages
Proc. SPIE 7741, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy V, 77411S (15 July 2010); doi: 10.1117/12.857464
Show Author Affiliations
M. D. Niemack, National Insitute of Standards and Technology (United States)
P. A. R. Ade, Cardiff Univ. (United Kingdom)
J. Aguirre, Univ. of Pennsylvania (United States)
F. Barrientos, Pontificía Univ. Católica (Chile)
J. A. Beall, National Insitute of Standards and Technology (United States)
J. R. Bond, Univ. of Toronto (Canada)
J. Britton, National Insitute of Standards and Technology (United States)
H. M. Cho, National Insitute of Standards and Technology (United States)
S. Das, Univ. of California, Berkeley (United States)
M. J. Devlin, Univ. of Pennsylvania (United States)
S. Dicker, Univ. of Pennsylvania (United States)
J. Dunkley, Oxford Univ. (United Kingdom)
R. Dünner, Pontificía Univ. Católica (Chile)
J. W. Fowler, Princeton Univ. (United States)
A. Hajian, Univ. of Toronto (Canada)
M. Halpern, Univ. of British Columbia (United States)
M. Hasselfield, Univ. of British Columbia (United States)
G. C. Hilton, National Insitute of Standards and Technology (United States)
M. Hilton, Univ. of KwaZulu-Natal (South Africa)
J. Hubmayr, National Insitute of Standards and Technology (United States)
J. P. Hughes, Rutgers Univ. (United States)
L. Infante, Pontificía Univ. Católica (Chile)
K. D. Irwin, National Insitute of Standards and Technology (United States)
N. Jarosik, Princeton Univ. (United States)
J. Klein, Univ. of Pennsylvania (United States)
A. Kosowsky, Univ. of Pittsburgh (United States)
T. A. Marriage, Princeton Univ. (United States)
J. McMahon, Univ. of Michigan (United States)
F. Menanteau, Rutgers Univ. (United States)
K. Moodley, Univ. of KwaZulu-Natal (South Africa)
J. P. Nibarger, National Insitute of Standards and Technology (United States)
M. R. Nolta, Univ. of Toronto (Canada)
L. A. Page, Princeton Univ. (United States)
B. Partridge, Haverford College (United States)
E. D. Reese, Univ. of Pennsylvania (United States)
J. Sievers, Univ. of Toronto (Canada)
D. N. Spergel, Princeton Univ. (United States)
S. T. Staggs, Princeton Univ. (United States)
R. Thornton, West Chester Univ. of Pennsylvania (United States)
C. Tucker, Cardiff Univ. (United Kingdom)
E. Wollack, NASA Goddard Space Flight Ctr. (United States)
K. W. Yoon, National Insitute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 7741:
Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy V
Wayne S. Holland; Jonas Zmuidzinas, Editor(s)

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