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Proceedings Paper

Broadband soft x-ray polarimetry
Author(s): Herman L. Marshall; Ralf K. Heilmann; Norbert S. Schulz; Kendrah D. Murphy
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Paper Abstract

We developed an instrument design capable of measuring linear X-ray polarization over a broad-band using conventional spectroscopic optics, using a method previously described by Marshall (2008) involving laterally graded, multilayer-coated flat mirrors. We present possible science investigations with such an instrument and two possible configurations. This instrument could be used in a small orbiting mission or scaled up for the International X-ray Observatory. Laboratory work has begun that would demonstrate the capabilities of key components.

Paper Details

Date Published: 30 July 2010
PDF: 10 pages
Proc. SPIE 7732, Space Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray, 77320F (30 July 2010); doi: 10.1117/12.857443
Show Author Affiliations
Herman L. Marshall, Massachusetts Institute of Technology (United States)
Ralf K. Heilmann, Massachusetts Institute of Technology (United States)
Norbert S. Schulz, Massachusetts Institute of Technology (United States)
Kendrah D. Murphy, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 7732:
Space Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray
Monique Arnaud; Stephen S. Murray; Tadayuki Takahashi, Editor(s)

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