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Proceedings Paper

High-contrast observations with slicer-based integral field spectrographs 1: simulations
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Paper Abstract

As part of the Phase A study for the EPICS instrument, we investigate if there are any contrast limitations imposed by the choice of the integral field spectrograph (IFS) technology, and if so, to determine the contrast limits applicable to each technology. In this document we investigate (through simulations) the contrast limitations inherent in a slicer based IFS. Current results show the achievable contrast with the slicer to be promising when taking into consideration the fact that the central region of the apodized PSF has not been masked. Limiting the maximum intensity by a factor of 100-1000 using an obscuring focal plane mask should also reduce the intensity of the secondary speckles by an equivalent factor. Furthermore, the secondary speckles created in the slicer spectrograph only influence the few slices where the bright central core is imaged. By orienting these slices to lie along the spider arms of the E-ELT secondary, the fraction of the field of view affected can be minimized.

Paper Details

Date Published: 20 July 2010
PDF: 10 pages
Proc. SPIE 7735, Ground-based and Airborne Instrumentation for Astronomy III, 77357K (20 July 2010); doi: 10.1117/12.857383
Show Author Affiliations
Graeme S. Salter, Univ. of Oxford (United Kingdom)
Niranjan A. Thatte, Univ. of Oxford (United Kingdom)
Mathias Tecza, Univ. of Oxford (United Kingdom)
Fraser Clarke, Univ. of Oxford (United Kingdom)
Christophe Verinaud, Lab. d'Astrophysique de l'Observatoire de Grenoble (France)
Markus E. Kasper, European Southern Observatory (Germany)

Published in SPIE Proceedings Vol. 7735:
Ground-based and Airborne Instrumentation for Astronomy III
Ian S. McLean; Suzanne K. Ramsay; Hideki Takami, Editor(s)

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