Share Email Print

Proceedings Paper

A method for the characterization of sub-pixel response of near-infrared detectors
Author(s): Tomasz P. Biesiadzinski; Gregory Tarlé; Michael J. Howe; Michael Schubnell; Wolfgang Lorenzon; Curtis Weaverdyck; Josh Larson
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Many future space telescope missions are designed as wide-field surveys. The increased area of the survey is often achieved by increasing the plate scale of the detectors. This can result in under-sampled instruments. Under these conditions response variations within an individual pixel degrade photometric and shape information of observed astronomical sources. These effects can be corrected for by mapping the sub-pixel response of all pixels on a detector. Measuring sub-pixel sensitivity by projecting a single, micron-size spot is effective in understanding intrapixel response variations, but the time required to create a detector-wide map is prohibitive. The existing Spot-O-Matic single spot projector concept, has been extended to the design of a multi-spot projector, the Spots-O-Matic, enabling the mapping of an entire detector. This new projector is under development to achieve the small spot size required for pixel characterization over the field of view of an entire detector.

Paper Details

Date Published: 16 July 2010
PDF: 9 pages
Proc. SPIE 7742, High Energy, Optical, and Infrared Detectors for Astronomy IV, 77421M (16 July 2010); doi: 10.1117/12.857377
Show Author Affiliations
Tomasz P. Biesiadzinski, Univ. of Michigan (United States)
Gregory Tarlé, Univ. of Michigan (United States)
Michael J. Howe, Univ. of Michigan (United States)
Michael Schubnell, Univ. of Michigan (United States)
Wolfgang Lorenzon, Univ. of Michigan (United States)
Curtis Weaverdyck, Univ. of Michigan (United States)
Josh Larson, Univ. of Michigan (United States)

Published in SPIE Proceedings Vol. 7742:
High Energy, Optical, and Infrared Detectors for Astronomy IV
Andrew D. Holland; David A. Dorn, Editor(s)

© SPIE. Terms of Use
Back to Top