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Proceedings Paper

The x-ray camera of the EXIST/SXI telescope
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Paper Abstract

The Energetic X-ray Imaging Survey Telescope (EXIST) mission, submitted to the Decadal Survey, is a multiwavelength observatory mainly devoted to the study of Super Massive Black Holes, Gamma Ray Bursts and other transient sources. The set of instruments foreseen for EXIST includes a soft x-ray telescope (SXI), proposed as a contribution of the Italian Space Agency (ASI). We present the baseline design of the X-Ray camera for SXI telescope, that we have finalized under ASI contract. The camera is based on a focal plane detector consisting of a 450 μm thick silicon pixel sensor sensitive, with high QE, in the full SXI range (0.1-10 KeV), and capable of high energy resolution when operated in photon counting mode (E/dE ~ 47 at 6 keV), frame rate ~ 100-200 frames/s (enabling timing in the ms range), and spatial resolution matching the optical characteristics of the mirror module. We provide an overview of the mechanical, thermal and electrical concept of the camera.

Paper Details

Date Published: 29 July 2010
PDF: 8 pages
Proc. SPIE 7732, Space Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray, 77324B (29 July 2010); doi: 10.1117/12.857217
Show Author Affiliations
Michela Uslenghi, INAF - IASF Milano (Italy)
Mauro Fiorini, INAF - IASF Milano (Italy)
Sandro Mereghetti, INAF - IASF Milano (Italy)
Gabriele E. Villa, INAF - IASF Milano (Italy)
Angela Bazzano, INAF - IASF Roma (Italy)
Patrizia A. Caraveo, INAF - IASF Milano (Italy)
Carlo E. Fiorini, Politecnico di Milano (Italy)
INAF - IASF Milano (Italy)
Jonathan E. Grindlay, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Lorenzo Natalucci, INAF - IASF Roma (Italy)
Giovanni Pareschi, Osservatorio Astronomico di Brera (Italy)
Gianpiero Tagliaferri, Osservatorio Astronomico di Brera (Italy)
Pietro Ubertini, INAF - IASF Roma (Italy)

Published in SPIE Proceedings Vol. 7732:
Space Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray
Monique Arnaud; Stephen S. Murray; Tadayuki Takahashi, Editor(s)

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