Share Email Print
cover

Proceedings Paper

Recent progress in wide-field imaging interferometry
Author(s): S. A. Rinehart; D. T. Leisawitz; M. R. Bolcar; K. M. Chaprnka; R. G. Lyon; S. F. Maher; N. Memarsadeghi; E. J. Sinukoff; E. Teichman
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The Wide-Field Imaging Interferometry Testbed (WIIT) at NASA's Goddard Space Flight Center and a computational model of the testbed were developed to demonstrate and learn the practical limitations of techniques for wide-field spatial-spectral ("double Fourier") interferometry. WIIT is an automated and remotely operated system, and it is now producing substantial amounts of high-quality data from its state-of-the-art operating environment, Goddard's Advanced Interferometry and Metrology Lab. In this paper, we discuss the characterization and operation of the testbed and present recently acquired data. We also give a short description of the computational model and its applications. Finally, we outline future research directions. A companion paper within this conference discusses the development of new widefield double Fourier data analysis algorithms.

Paper Details

Date Published: 21 July 2010
PDF: 9 pages
Proc. SPIE 7734, Optical and Infrared Interferometry II, 77342D (21 July 2010); doi: 10.1117/12.857108
Show Author Affiliations
S. A. Rinehart, NASA Goddard Space Flight Ctr. (United States)
D. T. Leisawitz, NASA Goddard Space Flight Ctr. (United States)
M. R. Bolcar, NASA Goddard Space Flight Ctr. (United States)
K. M. Chaprnka, NASA Goddard Space Flight Ctr. (United States)
R. G. Lyon, NASA Goddard Space Flight Ctr. (United States)
S. F. Maher, Science Systems and Applications, Inc. (United States)
N. Memarsadeghi, NASA Goddard Space Flight Ctr. (United States)
E. J. Sinukoff, McMaster Univ. (Canada)
E. Teichman, Univ. of Maryland, College Park (United States)


Published in SPIE Proceedings Vol. 7734:
Optical and Infrared Interferometry II
William C. Danchi; Françoise Delplancke; Jayadev K. Rajagopal, Editor(s)

© SPIE. Terms of Use
Back to Top