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Proceedings Paper

Bias-free imaging at low light levels
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Paper Abstract

Measurements from long-baseline interferometry are commonly analysed in terms of the power spectrum and the bispectrum (or triple-product) of the fringe patterns, as these estimators are invariant in the presence of phase instabilities. At low light levels, photon and detector noise give rise to systematic "bias" in the power spectrum and bispectrum. This paper extends previous work on computing the expected biases and variances for these quantities by introducing a general method which can be applied to any fringe-encoding scheme where the measurement equation is linear and to measurements affected by a combination of photon noise and detector noise. We apply our method to a number of interesting practical cases, including systems with unevenly-sampled fringe patterns and in the presence of read noise.

Paper Details

Date Published: 22 July 2010
PDF: 7 pages
Proc. SPIE 7734, Optical and Infrared Interferometry II, 77344A (22 July 2010); doi: 10.1117/12.857104
Show Author Affiliations
James Gordon, Univ. of Cambridge (United Kingdom)
David Buscher, Univ. of Cambridge (United Kingdom)
Hrobjartur Thorsteinsson, Univ. of Cambridge (United Kingdom)


Published in SPIE Proceedings Vol. 7734:
Optical and Infrared Interferometry II
William C. Danchi; Françoise Delplancke; Jayadev K. Rajagopal, Editor(s)

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