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Proceedings Paper

KMOS pick-off arm optical alignment, calibration, and testing
Author(s): Philip Rees; Richard J. Bennett; George H. Davidson; Stephen P. Todd
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Paper Abstract

The pick-off arm is the part of the KMOS instrument which re-images a sub-field of the VLT focal plane to a position outside of the main field where it can be used for integral field spectroscopy. In this paper we describe the optical alignment and test procedure developed to meet the challenging alignment requirements of the instrument. It is important to note that although the alignment is done at ambient temperature, the alignment of the optical components must be maintained at the instruments cryogenic operational temperature. This paper describes the methods used to achieve the absolute positioning accuracy and the test results obtained and discussed some of the practical difficulties that were encountered.

Paper Details

Date Published: 20 July 2010
PDF: 8 pages
Proc. SPIE 7735, Ground-based and Airborne Instrumentation for Astronomy III, 77354Z (20 July 2010); doi: 10.1117/12.857009
Show Author Affiliations
Philip Rees, UK Astronomy Technology Ctr., The Royal Observatory Edinburgh (United Kingdom)
Richard J. Bennett, UK Astronomy Technology Ctr., The Royal Observatory Edinburgh (United Kingdom)
George H. Davidson, UK Astronomy Technology Ctr., The Royal Observatory Edinburgh (United Kingdom)
Stephen P. Todd, UK Astronomy Technology Ctr., The Royal Observatory Edinburgh (United Kingdom)


Published in SPIE Proceedings Vol. 7735:
Ground-based and Airborne Instrumentation for Astronomy III
Ian S. McLean; Suzanne K. Ramsay; Hideki Takami, Editor(s)

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