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Proceedings Paper

The thermal analysis of the Hard X-ray Telescope (HXT) and the investigation of the deformation of the mirror foil due to temperature change
Author(s): Keitaro Ito; Keiji Ogi; Hisamitsu Awaki; Tatsuro Kosaka; Yasufumi Yamamoto
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Paper Abstract

The thin film technology called "depth-graded multi-layer" is used to manufacture reflector foils, which are inserted in a hard X-ray telescope. When the temperature of the foil changes from the temperature at which the foil was produced; thermal deformation is induced due to difference of linear coefficient of expansion of its constituents. The deformation causes performance of X-ray image formation to deteriorate. Therefore, it is absolutely imperative to estimate the amount of deformation quantitatively and to establish a method of temperature control for the foil under the thermal environment on orbit. We used the hard X-ray telescope, which is part of the currently-projected the ASTRO-H X-ray satellite, as an example for investigation. The effective method of the HXT thermal control was examined with the thermal analytical software, "Thermal Desktop". The deformation of the foil when the temperature was changed by 1 degree C was predicted by a finite element analysis (FEA). The thermal desktop analysis shows that the overall foil temperature in orbit can be close to the temperature at which the foils were produced (~22degree C) by the newly developed thermal control method. The FEM analysis shows that the prediction of the foil deformation due to a temperature change of 1 degree C is about 8 μm.

Paper Details

Date Published: 29 July 2010
PDF: 13 pages
Proc. SPIE 7732, Space Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray, 77323A (29 July 2010); doi: 10.1117/12.856581
Show Author Affiliations
Keitaro Ito, Ehime Univ. (Japan)
Keiji Ogi, Ehime Univ. (Japan)
Hisamitsu Awaki, Ehime Univ. (Japan)
Tatsuro Kosaka, Kochi Univ. of Technology (Japan)
Yasufumi Yamamoto, Ehime Univ. (Japan)


Published in SPIE Proceedings Vol. 7732:
Space Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray
Monique Arnaud; Stephen S. Murray; Tadayuki Takahashi, Editor(s)

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