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Proceedings Paper

KMOS: assembly, integration and testing of three 0.8-2.5 micron spectrographs
Author(s): Richard J. Masters; Ian J. Lewis; Ian A. J. Tosh; Mathias Tecza; James Lynn; Robert E. J. Watkins; Andrew Clack; Roger L. Davies; Niranjan A. Thatte; Mike Tacon; Rick Makin; Jon Temple; Alan Pearce
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Paper Abstract

KMOS is a second generation instrument in construction for use at the European Southern Observatory (ESO) Very Large Telescope (VLT). It operates in the near-infrared (0.8 to 2.5 microns) and employs 24 deployable, image slicing integral field units (IFUs) feeding three spectrographs. The spectrographs are designed and built by a partnership of the University of Oxford and Rutherford Appleton Laboratories (RAL). We describe the assembly, integration and alignment procedures involved in the construction of these spectrographs in detail. We also present the results of the cryogenic optical tests, including the first data taken through the full spectrograph optical train and the details of the test facility and procedures involved.

Paper Details

Date Published: 20 July 2010
PDF: 9 pages
Proc. SPIE 7735, Ground-based and Airborne Instrumentation for Astronomy III, 773551 (20 July 2010); doi: 10.1117/12.856423
Show Author Affiliations
Richard J. Masters, Univ. of Oxford (United Kingdom)
Ian J. Lewis, Univ. of Oxford (United Kingdom)
Ian A. J. Tosh, Rutherford Appleton Lab. (United Kingdom)
Mathias Tecza, Univ. of Oxford (United Kingdom)
James Lynn, Univ. of Oxford (United Kingdom)
Robert E. J. Watkins, Univ. of Oxford (United Kingdom)
Andrew Clack, Univ. of Oxford (United Kingdom)
Roger L. Davies, Univ. of Oxford (United Kingdom)
Niranjan A. Thatte, Univ. of Oxford (United Kingdom)
Mike Tacon, Univ. of Oxford (United Kingdom)
Rick Makin, Univ. of Oxford (United Kingdom)
Jon Temple, Univ. of Oxford (United Kingdom)
Alan Pearce, Rutherford Appleton Lab. (United Kingdom)

Published in SPIE Proceedings Vol. 7735:
Ground-based and Airborne Instrumentation for Astronomy III
Ian S. McLean; Suzanne K. Ramsay; Hideki Takami, Editor(s)

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