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Proceedings Paper

Methods of optimizing x-ray optical prescriptions for wide-field applications
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Paper Abstract

We are working on the development of a method for optimizing wide-field X-ray telescope mirror prescriptions, including polynomial coefficients, mirror shell relative displacements, and (assuming 4 focal plane detectors) detector placement along the optical axis and detector tilt. With our methods, we hope to reduce number of Monte-Carlo ray traces required to search the multi-dimensional design parameter space, and to lessen the complexity of finding the optimum design parameters in that space. Regarding higher order polynomial terms as small perturbations of an underlying Wolter I optic design, we begin by using the results of Monte-Carlo ray traces to devise trial analytic functions, for an individual Wolter I mirror shell, that can be used to represent the spatial resolution on an arbitrary focal surface. We then introduce a notation and tools for Monte-Carlo ray tracing of a polynomial mirror shell prescription which permits the polynomial coefficients to remain symbolic. In principle, given a set of parameters defining the underlying Wolter I optics, a single set of Monte-Carlo ray traces are then sufficient to determine the polymonial coefficients through the solution of a large set of linear equations in the symbolic coefficients. We describe the present status of this development effort.

Paper Details

Date Published: 29 July 2010
PDF: 14 pages
Proc. SPIE 7732, Space Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray, 77322L (29 July 2010); doi: 10.1117/12.856420
Show Author Affiliations
Ronald F. Elsner, NASA Marshall Space Flight Ctr. (United States)
Stephen L. O'Dell, NASA Marshall Space Flight Ctr. (United States)
Brian D. Ramsey, NASA Marshall Space Flight Ctr. (United States)
Martin C. Weisskopf, NASA Marshall Space Flight Ctr. (United States)

Published in SPIE Proceedings Vol. 7732:
Space Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray
Monique Arnaud; Stephen S. Murray; Tadayuki Takahashi, Editor(s)

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