Share Email Print

Proceedings Paper

Mid-infrared reflectance and transmittance measurements in the laboratory using field instruments
Author(s): Andre Jackson; Bryan Nash; Agustin Ifarraguerri
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper discusses methods developed for measuring the reflectance and transmittance of solid materials in the laboratory using instruments designed for the field. Having the ability to use field instruments to obtain lab-quality measurements negates the need for redundant instrumentation. In our work we use an ABB MR170 Fourier Transform Infrared (FTIR) spectroradiometer to collect infrared spectra of natural and manmade surfaces in a variety of terrains and environments. Our laboratory protocols are optimized for the 3-14μm region of the electromagnetic spectrum. We describe our measurement protocols and present sample data.

Paper Details

Date Published: 4 May 2010
PDF: 7 pages
Proc. SPIE 7687, Active and Passive Signatures, 768709 (4 May 2010); doi: 10.1117/12.855439
Show Author Affiliations
Andre Jackson, SAIC (United States)
Bryan Nash, SAIC (United States)
Agustin Ifarraguerri, SAIC (United States)

Published in SPIE Proceedings Vol. 7687:
Active and Passive Signatures
G. Charmaine Gilbreath; Chadwick T. Hawley, Editor(s)

© SPIE. Terms of Use
Back to Top