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Proceedings Paper

Colloidal chemistry routes for fabrication of nanoparticle-based metamaterials
Author(s): M. Corricelli; M. Striccoli; R. Comparelli; M. L. Curri
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Paper Abstract

Colloidal chemistry strategies are mature techniques, now able to provide highly processable nanocrystals (NCs) soluble in a variety solvents, possessing an adjustable organic interface, for obtaining assembled structures. Indeed the NCs can be organized in superstructures by means of spontaneous assembly, in order to bridge the gap between nanoand mesoscale. In self assembly procedures, the organization is driven by the intrinsic information coded into the building blocks, namely size, shape and surface chemistry. The distinct properties of the nanometer-scale "buildingblocks" can be thus harnessed in assemblies presenting new collective properties, which can be further engineered by controlling inter-particle spacing and by material processing. Self assembly approaches of colloidal NCs can effectively exploit the solvent evaporation to form closely packed superlattices, since collective interaction energy can overcome the entropy loss due to ordering. The control on the NC characteristics is then crucial for the achievement of well controlled superstructures, with long range order and stability, being the individual NCs considered as "artificial atoms" in such superlattice structures. In this perspective the emerging concept of NC based metamaterials, that is a material with properties occurring from the controlled positioning of the different interacting NCs in an assembly, arise.

Paper Details

Date Published: 29 April 2010
PDF: 7 pages
Proc. SPIE 7711, Metamaterials V, 77111A (29 April 2010); doi: 10.1117/12.855110
Show Author Affiliations
M. Corricelli, CNR, IPCF, Univ. di Bari (Italy)
Univ. di Bari (Italy)
M. Striccoli, CNR, IPCF, Univ. di Bari (Italy)
R. Comparelli, CNR, IPCF, Univ. di Bari (Italy)
M. L. Curri, CNR, IPCF, Univ. di Bari (Italy)


Published in SPIE Proceedings Vol. 7711:
Metamaterials V
Nigel P. Johnson; Ekmel Özbay; Richard W. Ziolkowski; Nikolay I. Zheludev, Editor(s)

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