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Proceedings Paper

Sensitivity enhancement of bimaterial MOEMS thermal imaging sensor array using 2-λ wavelength readout
Author(s): O. Ferhanoĝlu; H. Urey
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Paper Abstract

Diffraction gratings integrated with MEMS sensors offer sensitive displacement measurements. However, the sensitivity of the interferometric readout may drop significantly based on the sensor position. A two wavelength readout method was developed and tested previously in order to maintain the sensitivity of the readout > %50 maximum sensitivity over a broad range (i.e. several um's for visible wavelengths). This work demonstrates the sensitivity enhancement of a MEMS thermal imaging sensor array. Measurement of the target scene was performed using two lasers at different wavelengths (633, 650 nm). The diffracted 1st order light from the array was imaged onto a single CCD camera for both sources. The target scene was reconstructed by observing the change in the 1st diffracted order diffraction intensity for both wavelengths. Merging of the data, acquired with two different sources, is performed by assigning each pixel in the final image with the higher sensitivity pixel among two measurements. > 30% increase in the average sensitivity was demonstrated for the sensor array.

Paper Details

Date Published: 14 May 2010
PDF: 6 pages
Proc. SPIE 7718, Optical Micro- and Nanometrology III, 77180O (14 May 2010); doi: 10.1117/12.854753
Show Author Affiliations
O. Ferhanoĝlu, Koç University (Turkey)
H. Urey, Koç University (Turkey)

Published in SPIE Proceedings Vol. 7718:
Optical Micro- and Nanometrology III
Christophe Gorecki; Anand Krishna Asundi; Wolfgang Osten, Editor(s)

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