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Proceedings Paper

10-GHz 1.59-µm quantum dash passively mode-locked two-section lasers
Author(s): M. Dontabactouny; C. Rosenberg; E. Semenova; D. Larsson; K. Yvind; R. Piron; F. Grillot; O. Dehaese; N. Chevalier; S. Loualiche
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Paper Abstract

This paper reports the fabrication and the characterisation of a 10 GHz two-section passively mode-locked quantum dash laser emitting at 1.59 μm. The potential of the device's mode-locking is investigated through an analytical model taking into account both the material parameters and the laser geometry. Results show that the combination of a small absorbing section coupled to a high absorption coefficient can lead to an efficient mode-locking. Characterisation shows mode-locking operation though output pulses are found to be strongly chirped. Noise measurements demonstrate that the single side band phase noise does not exceed -80 dBc/Hz at 100 kHz offset leading to an average timing jitter as low as 800 fs. As compared to single QW lasers these results constitute a significant improvement and are of first importance for applications in optical telecommunications.

Paper Details

Date Published: 27 April 2010
PDF: 10 pages
Proc. SPIE 7720, Semiconductor Lasers and Laser Dynamics IV, 77201A (27 April 2010); doi: 10.1117/12.854705
Show Author Affiliations
M. Dontabactouny, CNRS, Lab. FOTON, Univ. Européenne de Bretagne (France)
C. Rosenberg, Technical Univ. of Denmark (Denmark)
E. Semenova, Technical Univ. of Denmark (Denmark)
D. Larsson, Technical Univ. of Denmark (Denmark)
K. Yvind, Technical Univ. of Denmark (Denmark)
R. Piron, CNRS, Lab. FOTON, Univ. Européenne de Bretagne (France)
F. Grillot, CNRS, Lab. FOTON, Univ. Européenne de Bretagne (France)
O. Dehaese, CNRS, Lab. FOTON, Univ. Européenne de Bretagne (France)
N. Chevalier, CNRS, Lab. FOTON, Univ. Européenne de Bretagne (France)
S. Loualiche, CNRS, Lab. FOTON, Univ. Européenne de Bretagne (France)


Published in SPIE Proceedings Vol. 7720:
Semiconductor Lasers and Laser Dynamics IV
Krassimir Panajotov; Marc Sciamanna; Angel A. Valle; Rainer Michalzik, Editor(s)

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