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Proceedings Paper

Optical chirality in plasmonic arrays of subwavelength Z-shaped apertures
Author(s): Maxim R. Shcherbakov; Polina P. Vabishchevich; Mikhail I. Dobynde; Tatyana V. Dolgova; Elena D. Mishina; Alexander S. Sigov; Andrey A. Fedyanin
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Paper Abstract

Optical chirality is reported in a silver thin film with an ordered array of subwavelength Z-shaped apertures. Normal incidence transmission of right-hand circular polarized light through the planar chiral nanostructure is found to be sensitive to the direction of the light propagation resembling well-known circular dichroism phenomenon. The relative transmission difference is increased in the spectral vicinity of the surface plasmon resonances and reaches 0.11. The azimuthal dependences of elliptization of light state are shown to depend upon the direction of light propagation and this effect is also addressed to optical chirality of the specimen. It is experimentally demonstrated that the metamaterial could be substituted for anisotropic lossy medium whose tensors of real and imaginary parts of permittivity are diagonalized in different Cartesian coordinate systems. The angle between these systems is experimentally found to reach 10° in the site of plasmon resonances.

Paper Details

Date Published: 29 April 2010
PDF: 7 pages
Proc. SPIE 7711, Metamaterials V, 771109 (29 April 2010); doi: 10.1117/12.854699
Show Author Affiliations
Maxim R. Shcherbakov, Lomonosov Moscow State Univ. (Russian Federation)
Polina P. Vabishchevich, Lomonosov Moscow State Univ. (Russian Federation)
Mikhail I. Dobynde, Lomonosov Moscow State Univ. (Russian Federation)
Tatyana V. Dolgova, Lomonosov Moscow State Univ. (Russian Federation)
Elena D. Mishina, Moscow Institute of Radioengeneering, Electronics and Automation (Russian Federation)
Alexander S. Sigov, Moscow Institute of Radioengeneering, Electronics and Automation (Russian Federation)
Andrey A. Fedyanin, Lomonosov Moscow State Univ. (Russian Federation)


Published in SPIE Proceedings Vol. 7711:
Metamaterials V
Nigel P. Johnson; Ekmel Özbay; Richard W. Ziolkowski; Nikolay I. Zheludev, Editor(s)

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