Share Email Print
cover

Proceedings Paper

Highly reflective intermediate layers in crystalline silicon thin film solar cell
Author(s): S. Lindekugel; M. Künle; S. Janz; S. Reber
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In this paper the applicability and efficiency of different intermediate layer (IL) stacks for the implementation in recrystallized wafer equivalent (RexWE) solar cells are investigated. The requirements for the IL in the RexWE concept are short term stability at temperatures above 1400 °C, high reflectivity for wavelengths exceeding 600 nm, electrical conductivity and acting as a diffusion barrier against metallic impurities. Various combinations of stoichiometric SiC layers, silicon rich SiC layers and SiO2 layers were tested as IL stacks regarding their performance after a zone melting recrystallization (ZMR) process. For the first time, samples with an IL consisting of a SiC multilayer were recrystallized and successfully processed to solar cells.

Paper Details

Date Published: 18 May 2010
PDF: 9 pages
Proc. SPIE 7725, Photonics for Solar Energy Systems III, 772506 (18 May 2010); doi: 10.1117/12.854675
Show Author Affiliations
S. Lindekugel, Fraunhofer Institute for Solar Energy Systems (Germany)
M. Künle, Fraunhofer Institute for Solar Energy Systems (Germany)
S. Janz, Fraunhofer Institute for Solar Energy Systems (Germany)
S. Reber, Fraunhofer Institute for Solar Energy Systems (Germany)


Published in SPIE Proceedings Vol. 7725:
Photonics for Solar Energy Systems III
Ralf B. Wehrspohn; Andreas Gombert, Editor(s)

© SPIE. Terms of Use
Back to Top