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Proceedings Paper

Principal problems of quality improvement for high-speed planar transmission lines issued from studies of high-Q microstrip resonators
Author(s): A. P. Chernyaev; V. A. Dravin; A. Yu. Golovanov; A. L. Karuzskii; A. E. Krapivka; A. N. Lykov; V. N. Murzin; A. V. Perestoronin; A. M. Tskhovrebov; N. A. Volchkov
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Paper Abstract

Possible approaches to improvement of quality of a high-speed planar transmission line are investigated by systematic study of superconductor high-Q microstrip resonators in the frequency range of order 10 GHz. Superconductor microstrip resonators with maximal highest quality-factors Q>105 were constructed. Relative contributions of spectral (geometrical and non-dissipative material properties), on one hand, and of dissipative (losses in materials) characteristics, on another hand, into the limitation of maximal achievable values of the quality of microstrip resonators are investigated. It is shown that the highest by now Q≥105 are limited dominantly by the spectral properties of microstrip resonators.

Paper Details

Date Published: 26 February 2010
PDF: 12 pages
Proc. SPIE 7521, International Conference on Micro- and Nano-Electronics 2009, 752119 (26 February 2010); doi: 10.1117/12.854461
Show Author Affiliations
A. P. Chernyaev, Moscow Institute of Physics and Technology (Russian Federation)
V. A. Dravin, P.N. Lebedev Physical Institute (Russian Federation)
A. Yu. Golovanov, P.N. Lebedev Physical Institute (Russian Federation)
Moscow Institute of Physics and Technology (Russian Federation)
A. L. Karuzskii, P.N. Lebedev Physical Institute (Russian Federation)
A. E. Krapivka, P.N. Lebedev Physical Institute (Russian Federation)
A. N. Lykov, P.N. Lebedev Physical Institute (Russian Federation)
V. N. Murzin, P.N. Lebedev Physical Institute (Russian Federation)
A. V. Perestoronin, P.N. Lebedev Physical Institute (Russian Federation)
A. M. Tskhovrebov, P.N. Lebedev Physical Institute (Russian Federation)
N. A. Volchkov, P.N. Lebedev Physical Institute (Russian Federation)


Published in SPIE Proceedings Vol. 7521:
International Conference on Micro- and Nano-Electronics 2009
Kamil A. Valiev; Alexander A. Orlikovsky, Editor(s)

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