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Proceedings Paper

40-GHz and 160-GHz mode-locked quantum-dot laser showing pulse width of 750 fs at 1.3 µm
Author(s): H. Schmeckebier; G. Fiol; C. Meuer; D. Arsenijević; D. Bimberg
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Paper Abstract

Based on frequency resolved optical gating, a pulse shape and phase characterization of a monolithic-two-section, quantum-dot mode-locked laser (QD-MLL) at 1.3 μm, at a repetition rate of 40 GHz, is presented. The dynamics of the absorber and the gain section are investigated in detail. Increasing the gain current leads to an increase of mostly linear chirp inducing significant pulse broadening. The absorber dynamics, namely the sweep out time of the carriers of the QDs, is enhanced at larger reverse biases. The quantum confined stark effect (QCSE) however reduces the absorber efficiency. Thus the shortest pulse width occurs for medium voltages. Pulses generated by hybrid mode locking are compared to passive mode-locked ones. Only a slight suppression of the trailing part of the pulses is found. Simulations as well as experiments demonstrate that the linear part of the chirp can be easily compensated leading to pulse compression. A pulse width of 700 fs is achieved almost independent of operating conditions. Temperature changes of 8°C leads to pulse broadening of a few hundred femtoseconds. Pulse combs up to 160 Gbit/s are generated using optical time division multiplexing (OTDM). Eye diagrams and autocorrelation measurements prove the suitability of our approach.

Paper Details

Date Published: 28 April 2010
PDF: 11 pages
Proc. SPIE 7720, Semiconductor Lasers and Laser Dynamics IV, 772010 (28 April 2010); doi: 10.1117/12.854405
Show Author Affiliations
H. Schmeckebier, Technische Univ. Berlin (Germany)
G. Fiol, Technische Univ. Berlin (Germany)
C. Meuer, Technische Univ. Berlin (Germany)
D. Arsenijević, Technische Univ. Berlin (Germany)
D. Bimberg, Technische Univ. Berlin (Germany)


Published in SPIE Proceedings Vol. 7720:
Semiconductor Lasers and Laser Dynamics IV
Krassimir Panajotov; Marc Sciamanna; Angel A. Valle; Rainer Michalzik, Editor(s)

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