Share Email Print
cover

Proceedings Paper

Optical tomography based on phase-shifting schlieren deflectometry
Author(s): Emmanuel Foumouo; Jean-Luc Dewandel; Luc Joannes; Didier Beghuin; Laurent Jacques; Philippe Antoine
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We present a new optical tomography technique based on phase-shifting schlieren deflectometry. The principle is that of computerized tomography. The three-dimensional profile is reconstructed from the deflection angles of rays passing through the tested object. We have investigated optical phantoms chosen in view of the characterization of dendritic growth in a solidification process. Promising results have been obtained with a homogeneous sphere and a bundle of 200μm fibers. The deviation angles exceed two degrees with a variation of the refractive index ▵n=0.025.

Paper Details

Date Published: 13 May 2010
PDF: 8 pages
Proc. SPIE 7726, Optical Sensing and Detection, 77260U (13 May 2010); doi: 10.1117/12.854063
Show Author Affiliations
Emmanuel Foumouo, Univ. Catholique de Louvain (Belgium)
Jean-Luc Dewandel, Lambda-X s.a. (Belgium)
Luc Joannes, Lambda-X s.a. (Belgium)
Didier Beghuin, Lambda-X s.a. (Belgium)
Laurent Jacques, Univ. Catholique de Louvain (Belgium)
Philippe Antoine, Univ. Catholique de Louvain (Belgium)


Published in SPIE Proceedings Vol. 7726:
Optical Sensing and Detection
Francis Berghmans; Anna Grazia Mignani; Chris A. van Hoof, Editor(s)

© SPIE. Terms of Use
Back to Top