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Proceedings Paper

Applications of scanning electron microscopy for improving quality of food products
Author(s): Zhongli Pan; Delilah F. Wood; Tina G. Williams; Junling Shi; Connie Shih; Cui Lu; Xuan Li
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Proc. SPIE 7729, Scanning Microscopy 2010, ; doi: 10.1117/12.853950
Show Author Affiliations
Zhongli Pan, USDA Agricultural Research Service (United States)
Delilah F. Wood, USDA Agricultural Research Service (United States)
Tina G. Williams, USDA Agricultural Research Service (United States)
Junling Shi, Northwest A&F Univ. (China)
Connie Shih, Univ. of California, Davis (United States)
Cui Lu, Northwest A&F Univ. (China)
Xuan Li, Univ. of California, Davis (United States)


Published in SPIE Proceedings Vol. 7729:
Scanning Microscopy 2010
Michael T. Postek; Dale E. Newbury; S. Frank Platek; David C. Joy, Editor(s)

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