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Proceedings Paper

3D shape measurement using curvature data - Erratum
Author(s): ByoungChang Kim; MinChel Kwon; ByoungUck Choo; InJeong Yoon
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Paper Abstract

errata

Paper Details

Date Published: 24 November 2009
PDF: 2 pages
Proc. SPIE 7389, Optical Measurement Systems for Industrial Inspection VI, 73893M (24 November 2009); doi: 10.1117/12.853927
Show Author Affiliations
ByoungChang Kim, Kyungnam Univ. (Korea, Republic of)
MinChel Kwon, Kyungnam Univ. (Korea, Republic of)
ByoungUck Choo, Samyang Optics Co., Ltd. (Korea, Republic of)
InJeong Yoon, Samyang Optics Co., Ltd. (Korea, Republic of)


Published in SPIE Proceedings Vol. 7389:
Optical Measurement Systems for Industrial Inspection VI
Peter H. Lehmann, Editor(s)

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