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Proceedings Paper

Comparability and uncertainty of shape measurements with white-light interferometers
Author(s): S. Boedecker; W. Bauer; R. Krüger-Sehm; P. H. Lehmann; C. Rembe
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Paper Abstract

We discuss how the results obtained from a white-light interferometer can be compared to tactile measurements. The core idea to achieve comparability is to determine a short cut-off wavelength up to which the spatial frequency components of the surface topography are measured with less than 3 dB attenuation. We demonstrate for different interferometers that the data has to be filtered to achieve a linear transfer characteristic which allows to define the short cut-off wavelength. In addition, we demonstrate investigations of the error sources in shape measurements that we have identified. Results of our work are influencing a VDI/VDE calibration guideline for shape measurements which is currently under development. We show in this paper how the procedure developed for the guideline can be employed to real measurement devices. Uncertainty contributions to the error budget are also discussed and measurements on shape standards are presented.

Paper Details

Date Published: 14 May 2010
PDF: 12 pages
Proc. SPIE 7718, Optical Micro- and Nanometrology III, 77180J (14 May 2010); doi: 10.1117/12.853901
Show Author Affiliations
S. Boedecker, Polytec GmbH (Germany)
W. Bauer, Polytec GmbH (Germany)
R. Krüger-Sehm, Physikalisch-Technische Bundesanstalt (Germany)
P. H. Lehmann, Univ. Kassel (Germany)
C. Rembe, Polytec GmbH (Germany)


Published in SPIE Proceedings Vol. 7718:
Optical Micro- and Nanometrology III
Christophe Gorecki; Anand Krishna Asundi; Wolfgang Osten, Editor(s)

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