Share Email Print

Proceedings Paper

Time resolved spectral analysis for pulsed lasers nonlinear effects characterization
Author(s): Patrick Beaure d'Augères; Alain Mugnier; David Pureur; Thierry Chartier
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We demonstrate a simple method to measure the evolution of nonlinear effects along a pulse. An all-fiber acousto-optic modulator is synchronized to the pulse emission and inserted between the laser output and an optical spectrum analyzer. Thanks to this configuration, the application of a short modulator opening time (10 ns typically) compared to the pulse width (100 ns typically) forms a spectral measurement window. This window is shifted along the pulse by the use of a variable trig delay. The optical spectrum is measured for each position of the window. The nonlinear effects evolution versus the instantaneous power can be characterized. To validate our method, we have analyzed the spectral evolution along 100 ns pulses from different fiber laser sources. We have observed that the spectral broadening due to Kerr effect appears first. Raman scattering occurs next for window positions corresponding to highest peak powers. Finally during the trailing edge course, nonlinear effects disappear in the reverse order of their apparition. This method has also been extended to measure the power inside and outside a pulse in order to deduce the rate of amplified spontaneous emission.

Paper Details

Date Published: 4 June 2010
PDF: 10 pages
Proc. SPIE 7728, Nonlinear Optics and Applications IV, 77280S (4 June 2010); doi: 10.1117/12.853794
Show Author Affiliations
Patrick Beaure d'Augères, Lab. Foton, CNRS (France)
Quantel Group (France)
Alain Mugnier, Quantel Group (France)
David Pureur, Quantel Group (France)
Thierry Chartier, Lab. Foton, CNRS (France)

Published in SPIE Proceedings Vol. 7728:
Nonlinear Optics and Applications IV
Benjamin J. Eggleton; Alexander Luis Gaeta; Neil G. R. Broderick, Editor(s)

© SPIE. Terms of Use
Back to Top