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Proceedings Paper

Physico-chemical characterization of engineered metal oxide nanoparticles: the critical role of microscopy
Author(s): A. La Fontaine; V. A. Coleman; A. K. Jämting; M. Lawn; J. Herrmann; J. R. Miles
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Paper Abstract

Three different methods for extracting zinc oxide (ZnO) and titanium dioxide (TiO2) nanoparticles from commercially available sunscreen were investigated to determine the most appropriate route for producing a sample suitable for measuring the primary particle size. Direct dilution of the formulation, centrifugal methods and chemical washing were trialed in combination with ultrasonic processing and surfactant addition to generate samples that are suitable for particle size analysis. Transmission electron microscopy (TEM) and dynamic light scattering (DLS) were used to monitor the extraction and re-dispersion process. Washing with hexane, methanol and water to remove the formulation, in combination with pulsed high-powered ultrasonication and the addition of a charge-stabilizing surfactant was found to be the most efficient way of producing de-agglomerated samples. DLS measurements gave average hydrodynamic particle diameters of 87 nm for ZnO and 76 nm for TiO2, compared to equivalent spherical particle diameters of 21 ± 12 nm for ZnO (81 particles) and 19 ± 14 nm for TiO2 (81 particles) obtained from TEM analysis.

Paper Details

Date Published: 3 June 2010
PDF: 7 pages
Proc. SPIE 7729, Scanning Microscopy 2010, 77290Q (3 June 2010); doi: 10.1117/12.853772
Show Author Affiliations
A. La Fontaine, National Measurement Institute of Australia (Australia)
V. A. Coleman, National Measurement Institute of Australia (Australia)
A. K. Jämting, National Measurement Institute of Australia (Australia)
M. Lawn, National Measurement Institute of Australia (Australia)
J. Herrmann, National Measurement Institute of Australia (Australia)
J. R. Miles, National Measurement Institute of Australia (Australia)


Published in SPIE Proceedings Vol. 7729:
Scanning Microscopy 2010
Michael T. Postek; Dale E. Newbury; S. Frank Platek; David C. Joy, Editor(s)

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