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Proceedings Paper

Dielectric slot tip for scanning near-field microwave microscope
Author(s): Patrick Leidenberger; Christian Hafner
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Paper Abstract

While tapered and coated fibers are used as probes for scanning near-field optical microscopy SNOM), tapered coaxial probes and other structures are used in the microwave regime for broad band measurements. Aperture probes, tapered fibers and tapered waveguides have the inherent disadvantage that the radiation will have to pass a cutoff region. This is not the case for coaxial probes and for appropriately chosen transmission lines based on metallic wires. To enhance the energy transition for a tapered SNOM tip, the cladding can be split by milling longitudinal slits in it. We demonstrate the principle of mode conversion in the microwave region, building a tip for a scanning near-field microwave microscope SNMM) with a feed similar to a SNOM tip with the slits in the cladding. Transition to a single wire mode is made at the very end of the tip. With this new kind of SNMM tip we scan a test structure and demonstrate a resolution of 1/882 wavelengths for double passage operation.

Paper Details

Date Published: 3 June 2010
PDF: 8 pages
Proc. SPIE 7729, Scanning Microscopy 2010, 77291K (3 June 2010); doi: 10.1117/12.853727
Show Author Affiliations
Patrick Leidenberger, ETH Zürich (Switzerland)
Christian Hafner, ETH Zürich (Switzerland)


Published in SPIE Proceedings Vol. 7729:
Scanning Microscopy 2010
Michael T. Postek; Dale E. Newbury; S. Frank Platek; David C. Joy, Editor(s)

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