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Proceedings Paper

Estimating the phase in interferomety: performance comparison between multi-mode and single-mode schemes
Author(s): E. Tatulli; N. Blind; F. Malbet; A. Chelli; J.-P. Berger
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Paper Abstract

In this paper we compare the performance of multi and single-mode interferometry for the estimation of the phase of the complex visibility in presence of detector, photon and atmospheric noises. We show that, despite the loss of flux occurring when injecting the light in the single-mode component, the spatial filtering properties of such single-mode devices often enable higher performance than multimode concepts. In the high flux regime speckle noise dominated, single-mode interferometry is always more efficient, and its performance is significantly better when the correction provided by adaptive optics becomes poor, by a factor of 2 and more when the Strehl ratio is lower than 10%. In detector noise regime, multimode interferometry reaches better performance, yet the gain never exceeds 20%, which corresponds to the percentage of photon loss due to the injection in the guides. We finally show that single-mode interferometry is also more robust to the turbulence in both cases of fringe tracking and phase referencing, at the exception of narrow field of views. We conclude that fringe trackers built using single-mode optics should be considered as a solution both practical and competitive.

Paper Details

Date Published: 2 August 2010
PDF: 11 pages
Proc. SPIE 7734, Optical and Infrared Interferometry II, 77342F (2 August 2010); doi: 10.1117/12.853672
Show Author Affiliations
E. Tatulli, Lab. d'Astrophysique de l'Observatoire de Grenoble (France)
N. Blind, Lab. d'Astrophysique de l'Observatoire de Grenoble (France)
F. Malbet, Lab. d'Astrophysique de l'Observatoire de Grenoble (France)
A. Chelli, Lab. d'Astrophysique de l'Observatoire de Grenoble (France)
J.-P. Berger, European Southern Observatory (Chile)

Published in SPIE Proceedings Vol. 7734:
Optical and Infrared Interferometry II
William C. Danchi; Françoise Delplancke; Jayadev K. Rajagopal, Editor(s)

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