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Proceedings Paper

Measurement of shafts in the production process based on x-rays
Author(s): Björn Damm; Robert Schmitt; Arno Rehbein; Raimund Volk; Ernst Neumann; Alexander Warrikhoff; Randolf Hanke; Stefan Kasperl; Christoph Funk; Jochen Hiller; Michael Krumm; Frank Sukowski; Norman Uhlmann; Rolf Behrendt
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Paper Abstract

Production metrology faces challenges connected to the production industry where consumers of products expect a standard of high quality at inexpensive costs. One approach for the next generation of production metrology devices aims at ensuring the quality of the process technologies in every single process step, therefore measuring in-process. One example of today's production metrology devices is the measurement of shafts in the production. Shafts are vital for every mechanical device that translates rotational energies and the tolerances based on diameter or roundness are in the range of microns. Those shaft measurement devices are either based on tactile measurements or on visible light which cannot be utilized as an in-process device. A novel idea is to use X-rays instead of tactile or visible light methods to be able to acquire robust measurement data despite of distorting debris like water, oil or dust. One focus is set on algorithms that allow robust measurements of diameter and roundness despite of distorting debris like water, oil or dust. The measurement uncertainty of the new method has been investigated and results will be introduced.

Paper Details

Date Published: 4 May 2010
PDF: 12 pages
Proc. SPIE 7723, Optics, Photonics, and Digital Technologies for Multimedia Applications, 77230S (4 May 2010); doi: 10.1117/12.853592
Show Author Affiliations
Björn Damm, RWTH Aachen (Germany)
Robert Schmitt, RWTH Aachen (Germany)
Arno Rehbein, RWTH Aachen (Germany)
Raimund Volk, HOMMEL-ETAMIC GmbH (Germany)
Ernst Neumann, HOMMEL-ETAMIC GmbH (Germany)
Alexander Warrikhoff, rtw Röntgentechnik Dr. Warrikhoff GmbH & Co. KG (Germany)
Randolf Hanke, Fraunhofer IZFP Saarbrücken und IIS Erlangen (Germany)
Stefan Kasperl, Fraunhofer IZFP Saarbrücken und IIS Erlangen (Germany)
Christoph Funk, Fraunhofer IZFP Saarbrücken und IIS Erlangen (Germany)
Jochen Hiller, Fraunhofer IZFP Saarbrücken und IIS Erlangen (Germany)
Michael Krumm, Fraunhofer IZFP Saarbrücken und IIS Erlangen (Germany)
Frank Sukowski, Fraunhofer IZFP Saarbrücken und IIS Erlangen (Germany)
Norman Uhlmann, Fraunhofer IZFP Saarbrücken und IIS Erlangen (Germany)
Rolf Behrendt, Fraunhofer-Institut für Integrierte Schaltungen (Germany)


Published in SPIE Proceedings Vol. 7723:
Optics, Photonics, and Digital Technologies for Multimedia Applications
Peter Schelkens; Touradj Ebrahimi; Gabriel Cristóbal; Frédéric Truchetet; Pasi Saarikko, Editor(s)

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