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Proceedings Paper

Performance limitations of compressive sensing for millimeter wave imaging
Author(s): Jonathan Lynch; Roy Matic; Joshua Baron
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Paper Abstract

The authors present an analysis of compressive sensing (CS) as applied to millimeter wave and optical imaging systems, showing that the technique inherently reduces detection efficiency due to reflection and diffraction effects of the underlying electromagnetics. The results show that single-detector imaging approaches that rely on simultaneous detection of multiple spatial modes (i.e., image pixels) require an electrically large detector to maintain high detection efficiency.

Paper Details

Date Published: 27 April 2010
PDF: 8 pages
Proc. SPIE 7670, Passive Millimeter-Wave Imaging Technology XIII, 76700D (27 April 2010); doi: 10.1117/12.853090
Show Author Affiliations
Jonathan Lynch, HRL Labs., LLC (United States)
Roy Matic, HRL Labs., LLC (United States)
Joshua Baron, HRL Labs., LLC (United States)

Published in SPIE Proceedings Vol. 7670:
Passive Millimeter-Wave Imaging Technology XIII
David A. Wikner; Arttu R. Luukanen, Editor(s)

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