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Proceedings Paper

Zeroes of amplitude of s and p components of linearly polarized light at the reflection from a system 'thin dielectric film - absorbing basis'
Author(s): M. Yu. Sakhnovskyj; B. M. Tymochko; V. M. Rudeichuk
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Paper Abstract

The polarization properties of dielectric films on an absorbing substrate in a neighbourhood of bifurcation points are investigated. It is shown that polarimetric and ellipsometric measurements of optic-geometric parameters of film structures are most sensitive in the areas of a bifurcation.

Paper Details

Date Published: 31 December 2009
PDF: 7 pages
Proc. SPIE 7388, Ninth International Conference on Correlation Optics, 738814 (31 December 2009); doi: 10.1117/12.853078
Show Author Affiliations
M. Yu. Sakhnovskyj, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
B. M. Tymochko, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
V. M. Rudeichuk, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)


Published in SPIE Proceedings Vol. 7388:
Ninth International Conference on Correlation Optics
Oleg V. Angelsky, Editor(s)

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