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Proceedings Paper

Surface structure changes in cement paste exposed to 10.6μm laser radiation
Author(s): J. J. Soto-Bernal; M. R. Moreno-Virgen; C. Frausto-Reyes; A. Bonilla-Petriciolet; J. T. Vega-Durán; J. Pineda-Piñón; J. A. Ortiz-Lozano
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Paper Abstract

We report the changes occurring in cement pastes irradiated by 10.6μm CO2 laser at different stages of hydration. Raman spectroscopy, X-rays and Scanning Electronic Microscopy (SEM) techniques had been used to observe molecular structural changes. Intensity of cement paste Raman peaks after laser irradiation was monitored in samples irradiated 2, 3, 4, 5, 6, 7, 8, 9, 10 and 11 days after their preparation. Applied laser power changed Raman peaks intensity at 187.5cm-1, 563cm-1, 695cm-1, 750cm-1, 897cm-1, 1042cm-1 and 1159cm-1 that corresponds to compounds already presents in cement pastes. X ray diffraction and SEM images confirm the recrystalization of cement paste compounds into new phases (alite and belite) after irradiation. The produced changes show a clear dependence on the applied laser power density and age of samples.

Paper Details

Date Published: 4 December 2009
PDF: 8 pages
Proc. SPIE 7499, Seventh Symposium Optics in Industry, 74991D (4 December 2009); doi: 10.1117/12.852953
Show Author Affiliations
J. J. Soto-Bernal, Instituto Tecnológico de Aguascalientes (Mexico)
Ctr. de Investigaciones en Optica, A.C. (Mexico)
M. R. Moreno-Virgen, Instituto Tecnológico de Aguascalientes (Mexico)
Ctr. de Investigación en Ciencia Aplicada y Tecnología Avanzada, IPN (Mexico)
C. Frausto-Reyes, Ctr. de Investigaciones en Optica, A.C. (Mexico)
A. Bonilla-Petriciolet, Instituto Tecnológico de Aguascalientes (Mexico)
J. T. Vega-Durán, Ctr. de Investigación en Ciencia Aplicada y Tecnología Avanzada, IPN (Mexico)
J. Pineda-Piñón, Ctr. de Investigación en Ciencia Aplicada y Tecnología Avanzada, IPN (Mexico)
J. A. Ortiz-Lozano, Univ. Autónoma de Aguascalientes (Mexico)


Published in SPIE Proceedings Vol. 7499:
Seventh Symposium Optics in Industry
Guillermo García Torales; Jorge L. Flores Núñez; Gilberto Gómez Rosas; Eric Rosas, Editor(s)

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