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Proceedings Paper

Versatile smart optical material characterizer system
Author(s): Yeonjoon Park; SangJoon Park; Uhn Lee; Kunik Lee; Sang Choi
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Paper Abstract

A versatile optical characterization system is fabricated to measure various optical properties of materials and devices. The optical system is based on Michelson interferometer with advanced software algorithm to measure the intensity, phase angle, polarization state, and coherence of transmitted or reflected light from the materials and devices under test. Innovative contour map of phase/intensity vs. time/physical-quantity relation shows the dynamic evolution of interference patterns of multiple points in the analysis area. Advanced software semi-automatically calculates change of photon intensity, phase angle, polarization, and coherence which are results of various applied physical quantities such as voltage, electric field, current, temperature, pressure, chemical density, and reaction time. The measured optical property changes are converted by software to the changes of intrinsic and extrinsic properties of materials and devices under test. The system is designed for multi-point measurements which are suitable for 2D-array-pixel type devices. Therefore, this versatile optical measurement system can accelerate the development of advanced adaptive optics elements and phase control elements.

Paper Details

Date Published: 21 April 2010
PDF: 8 pages
Proc. SPIE 7646, Nanosensors, Biosensors, and Info-Tech Sensors and Systems 2010, 764613 (21 April 2010); doi: 10.1117/12.852774
Show Author Affiliations
Yeonjoon Park, National Institute of Aerospace (United States)
SangJoon Park, Kyungwon Univ. (Korea, Republic of)
Uhn Lee, Gachon Univ. Gil Medical Ctr. (Korea, Republic of)
Kunik Lee, Federal Highway Administration (United States)
Sang Choi, NASA Langley Research Ctr. (United States)


Published in SPIE Proceedings Vol. 7646:
Nanosensors, Biosensors, and Info-Tech Sensors and Systems 2010
Vijay K. Varadan, Editor(s)

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