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Proceedings Paper

Risk-based verification, validation, and accreditation process
Author(s): James N. Elele; Jeremy Smith
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Paper Abstract

This paper presents a risk-based Verification, Validation, and Accreditation (VV&A) process for Models and Simulations (M&S). Recently, the emphasis on M&S used to support Department of Defense (DoD) acquisition has been based on the level of resources allocated to establishing the credibility of the M&S on the risks associated with the decision being supported by the M&S. In addition, DoD VV&A regulations recommend tailoring the V&V process to allow efficient use of resources. However, one problem is that no methodology is specified for such tailoring processes. The BMV&V has developed a risk-based process that implements tailoring of the VV&A activities based on risk. Our process incorporates MIL-STD 3022 for new M&S. For legacy M&S, the process starts by first assessing the current risk level of the M&S based on the credibility attributes of the M&S as defined through its Capability, Accuracy and Usability, relative to the articulated Intended Use Statement (IUS). If the risk is low, the M&S is credible for application, and no further V&V is required. If the risk is medium or high, the Accreditation Authority determines whether the M&S can be accepted as-is or if the risk should be mitigated. If the Accreditation Authority is willing to accept the risks, then a Conditional Accreditation is made. If the risks associated with using the M&S as-is are deemed too high to accept, then a Risk Mitigation/Accreditation Plan is developed to guide the process. The implementation of such a risk mitigation plan is finally documented through an Accreditation Support Package.

Paper Details

Date Published: 1 May 2010
PDF: 11 pages
Proc. SPIE 7705, Modeling and Simulation for Defense Systems and Applications V, 77050E (1 May 2010); doi: 10.1117/12.852419
Show Author Affiliations
James N. Elele, Naval Air Systems Command (United States)
Jeremy Smith, Naval Air Systems Command (United States)


Published in SPIE Proceedings Vol. 7705:
Modeling and Simulation for Defense Systems and Applications V
Eric J. Kelmelis, Editor(s)

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