Share Email Print
cover

Proceedings Paper

Characterization of material reflectance variation through measurement and simulation
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The characterization of material reflectance properties is important in the analysis of hyperspectral and polarization imagery as well as accurate simulation of such images. This paper merges the results of empirical reflectance property (spectral pBRDF) measurements with detailed model based simulations. The empirical data are collected with a laboratory spectroradiometer as well as an RIT-developed spectro-polarimetric imaging goniometer. The modeling uses an adaptation of RIT's Digital Imaging and Remote Sensing Image Generation (DIRSIG) model to capture the radiative transfer in rough surfaces with micron-scale features. Measurements and model results for several man-made materials under various conditions are presented.

Paper Details

Date Published: 13 May 2010
PDF: 11 pages
Proc. SPIE 7695, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XVI, 76950P (13 May 2010); doi: 10.1117/12.852211
Show Author Affiliations
John Kerekes, Rochester Institute of Technology (United States)
Caitlin Hart, Rochester Institute of Technology (United States)
Michael Gartley, Rochester Institute of Technology (United States)
Brent Bartlett, Rochester Institute of Technology (United States)
C. Eric Nance, Raytheon Intelligence and Information Systems (United States)


Published in SPIE Proceedings Vol. 7695:
Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XVI
Sylvia S. Shen; Paul E. Lewis, Editor(s)

© SPIE. Terms of Use
Back to Top