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Proceedings Paper

The effect to bending fatigue strength of 65 mn under torsion strain-hardening
Author(s): Guangping Zou; Qichao Xue; Wei Li
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Paper Abstract

Bending Fatigue experiments for 65Mn are carried out to study the effects of torsion strain-hardening. Firstly bending fatigue specimens are pre-twisted for torsion strain-hardening by using torsion testing machine. And specimens are divided as 8 groups and each group has 8 specimens. A series of plastic shear strains are applied to each group. Then bending fatigue experiments are carried on to estimate torsion fatigue strength by fatigue bending machine. Finally micrograms of fatigue damage are taken by stereo microscope. The test results showed that torsion strain-hardening has a certain effects that when torsion plastic strain is small, bending fatigue strength is increased. Oppositely, when torsion plastic strain is large, bending fatigue strength are all decreased in a large rate compared with specimens without torsion strain-hardening. Comparing different test results and corresponding paragraphs obtained from stereo microscope, a reasonable explanation can be deduced by using metal micromechanics theory and crystal lattice dislocation theory. A possible reason is that when torsion plastic strain is small, there will be more dislocation in crystal lattice, which can raise the fatigue strength. And when torsion plastic strain is large, dislocations are piled up in some position which can bring flaws under loads, which reduce the fatigue strength of specimen.

Paper Details

Date Published: 14 April 2010
PDF: 7 pages
Proc. SPIE 7522, Fourth International Conference on Experimental Mechanics, 75225R (14 April 2010); doi: 10.1117/12.851648
Show Author Affiliations
Guangping Zou, Harbin Engineering Univ. (China)
Qichao Xue, Harbin Engineering Univ. (China)
Wei Li, Harbin Engineering Univ. (China)


Published in SPIE Proceedings Vol. 7522:
Fourth International Conference on Experimental Mechanics
Chenggen Quan; Kemao Qian; Anand Krishna Asundi; Fook Siong Chau, Editor(s)

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