Share Email Print
cover

Proceedings Paper

Metrology CT technology and its applications in the precision engineering industry
Author(s): Gerhard Schick
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

X-ray computed tomography (CT) provides a fast and powerful method to extract the geometrical features of complex parts. CT reconstructs an object from X-ray projection images and has long been used for qualitative investigation of internal structures in industrial applications. Recently, cone-beam CT has been adapted to the task of high-precision dimensional metrology of machined parts, providing a method of rapidly acquiring comprehensive and quantitative data on parts of arbitrary complexity. High-power micro-focus X-ray tubes, large-size flat panel X-ray detectors, very accurate linear and rotary drives and a high-performance reconstruction solution are combined to image and measure a wide spectrum of parts manufactured from polymer and metal alloys according to established metrology standards. Various calibration techniques are used at the several stages of the measurement process to e.g. characterize the behavior of X-ray tube and detector and precisely define the imaging geometry. To verify the measurement accuracy, suitable objects such as geometrical elements are calibrated according to international standards and then measured using the CT. CT can then be used as an accurate tool for non-destructive testing (such as porosity analysis and assembly checks), reverse engineering, nominal-actual comparisons and dimensional metrology of industrial precision parts.

Paper Details

Date Published: 14 April 2010
PDF: 8 pages
Proc. SPIE 7522, Fourth International Conference on Experimental Mechanics, 75223S (14 April 2010); doi: 10.1117/12.851634
Show Author Affiliations
Gerhard Schick, Carl Zeiss Pte. Ltd. (Singapore)


Published in SPIE Proceedings Vol. 7522:
Fourth International Conference on Experimental Mechanics
Chenggen Quan; Kemao Qian; Anand Krishna Asundi; Fook Siong Chau, Editor(s)

© SPIE. Terms of Use
Back to Top