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Proceedings Paper

Meso-moiré fringe observation of nano-particle structures by electron moiré method
Author(s): Satoshi Kishimoto; Yusuke Yamauchi
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Paper Abstract

A new method to measure the spacing and direction in the ordered assembled nanoparticles by using the electron Moiré new method to measure the spacing and direction in the ordered assembled nanoparticles by using the electron Moiré fringes has been developed. In this method an assembled nanoparticle array can be consider as a model grid. When the electron beam was irradiated on the top of the nanoparticles, the amount of secondary electrons per primary electron is quite large. On the other hand, when the electron beam was irradiated on the valley among the neighboring nanoparticles, the amount of secondary electrons per primary electron is smaller. The difference of the generated secondary electrons per a primary electron fabricate periodical bright and dark pattern, which is the electron mesomoiré fringes. Using this method, the spacing and orientation of the assembled nanoparticle array was measured. new method to measure the spacing and direction in the ordered assembled nanoparticles by using the electron Moiré fringes has been developed. In this method an assembled nanoparticle array can be consider as a model grid. When the electron beam was irradiated on the top of the nanoparticles, the amount of secondary electrons per primary electron is quite large. On the other hand, when the electron beam was irradiated on the valley among the neighboring nanoparticles, the amount of secondary electrons per primary electron is smaller. The difference of the generated secondary electrons per a primary electron fabricate periodical bright and dark pattern, which is the electron mesomoiré fringes. Using this method, the spacing and orientation of the assembled nanoparticle array was measured. fringes has been developed. In this method an assembled nanoparticle array can be consider as a model grid. When the electron beam was irradiated on the top of the nanoparticles, the amount of secondary electrons per primary electron is quite large. On the other hand, when the electron beam was irradiated on the valley among the neighboring nanoparticles, the amount of secondary electrons per primary electron is smaller. The difference of the generated secondary electrons per a primary electron fabricate periodical bright and dark pattern, which is the electron mesomoiré fringes. Using this method, the spacing and orientation of the assembled nanoparticle array was measured.

Paper Details

Date Published: 15 April 2010
PDF: 9 pages
Proc. SPIE 7522, Fourth International Conference on Experimental Mechanics, 75220L (15 April 2010); doi: 10.1117/12.851593
Show Author Affiliations
Satoshi Kishimoto, National Institute for Materials Science (Japan)
Yusuke Yamauchi, National Institute for Materials Science (Japan)


Published in SPIE Proceedings Vol. 7522:
Fourth International Conference on Experimental Mechanics
Chenggen Quan; Kemao Qian; Anand Krishna Asundi; Fook Siong Chau, Editor(s)

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