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Proceedings Paper

Influence of OPD in wavelength-shifting interferometry
Author(s): Hongjun Wang; Ailing Tian; Bingcai Liu; Juanjuan Dang
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Paper Abstract

Phase-shifting interferometry is a powerful tool for high accuracy optical measurement. It operates by change the optical path length in the reference arm or test arm. This method practices by move optical device. So it has much problem when the optical device is very large and heavy. For solve this problem, the wavelength-shifting interferometry was put forwarded. In wavelength-shifting interferometry, the phase shifting angle was achieved by change the wavelength of optical source. The phase shifting angle was decided by wavelength and OPD (Optical Path Difference) between test and reference wavefront. So the OPD is an important factor to measure results. But in measurement, because the positional error and profile error of under testing optical element is exist, the phase shifting angle is different in different test point when wavelength scanning, it will introduce phase shifting angle error, so it will introduce optical surface measure error. For analysis influence of OPD on optical surface error, the relation between surface error and OPD was researched. By simulation, the relation between phase shifting error and OPD was established. By analysis, the error compensation method was put forward. After error compensation, the measure results can be improved to great extend.

Paper Details

Date Published: 14 April 2010
PDF: 8 pages
Proc. SPIE 7522, Fourth International Conference on Experimental Mechanics, 75225B (14 April 2010); doi: 10.1117/12.851446
Show Author Affiliations
Hongjun Wang, Xi'an Technological Univ. (China)
Ailing Tian, Xi'an Technological Univ. (China)
Bingcai Liu, Xi'an Technological Univ. (China)
Juanjuan Dang, Xi'an Technological Univ. (China)


Published in SPIE Proceedings Vol. 7522:
Fourth International Conference on Experimental Mechanics
Chenggen Quan; Kemao Qian; Anand Krishna Asundi; Fook Siong Chau, Editor(s)

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