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Proceedings Paper

Polarization-interferometric nonlinear confocal microscopy for measuring nano-sized objects
Author(s): Chikara Egami; Hironori Tanaka; Haruyuki Murakami; Satoshi Ota
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Paper Abstract

Polarization-interferometric nonlinear confocal microscopy is proposed for measuring a nano-sized object (such as nano particle) with lower linear absortion. A three-dimensional distribution of third-order nonlinear dielectric polarization was observed.

Paper Details

Date Published: 15 April 2010
PDF: 8 pages
Proc. SPIE 7522, Fourth International Conference on Experimental Mechanics, 75225G (15 April 2010); doi: 10.1117/12.850975
Show Author Affiliations
Chikara Egami, Shizuoka Univ. (Japan)
JST-CREST (Japan)
Hironori Tanaka, Shizuoka Univ. (Japan)
JST-CREST (Japan)
Haruyuki Murakami, Shizuoka Univ. (Japan)
JST-CREST (Japan)
Satoshi Ota, Shizuoka Univ. (Japan)
JST-CREST (Japan)


Published in SPIE Proceedings Vol. 7522:
Fourth International Conference on Experimental Mechanics

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